JPH025600Y2 - - Google Patents
Info
- Publication number
- JPH025600Y2 JPH025600Y2 JP1981073917U JP7391781U JPH025600Y2 JP H025600 Y2 JPH025600 Y2 JP H025600Y2 JP 1981073917 U JP1981073917 U JP 1981073917U JP 7391781 U JP7391781 U JP 7391781U JP H025600 Y2 JPH025600 Y2 JP H025600Y2
- Authority
- JP
- Japan
- Prior art keywords
- chute
- stopper
- elements
- chute surface
- stopped
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Control Of Conveyors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1981073917U JPH025600Y2 (en]) | 1981-05-20 | 1981-05-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1981073917U JPH025600Y2 (en]) | 1981-05-20 | 1981-05-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57186038U JPS57186038U (en]) | 1982-11-26 |
JPH025600Y2 true JPH025600Y2 (en]) | 1990-02-09 |
Family
ID=29869687
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1981073917U Expired JPH025600Y2 (en]) | 1981-05-20 | 1981-05-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH025600Y2 (en]) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60176599U (ja) * | 1984-04-28 | 1985-11-22 | 株式会社日立国際電気 | Icハンドラの異種ic搬送用シユ−ト |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6317276Y2 (en]) * | 1980-12-29 | 1988-05-16 |
-
1981
- 1981-05-20 JP JP1981073917U patent/JPH025600Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS57186038U (en]) | 1982-11-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE19750949B4 (de) | Testhandhabungsvorrichtung für horizontalen Transport | |
US6247629B1 (en) | Wire bond monitoring system for layered packages | |
JP3226780B2 (ja) | 半導体装置のテストハンドラ | |
US5834838A (en) | Pin array set-up device | |
US3584741A (en) | Batch sorting apparatus | |
JPH0894705A (ja) | プローブ式テストハンドラー及びそれを用いたicのテスト方法並びにic | |
JPS5856388A (ja) | 自動超小形電子部品配置装置 | |
USRE38894E1 (en) | Method and apparatus for testing integrated circuits | |
JPH025600Y2 (en]) | ||
JP2940858B2 (ja) | Ic試験装置 | |
JPS61228362A (ja) | Ic自動試験装置 | |
JPH0514426B2 (en]) | ||
US6681352B1 (en) | Method for testing damaged integrated circuits | |
CN221766699U (zh) | 植针机 | |
JPS6240434Y2 (en]) | ||
JPH083471B2 (ja) | 半田フィレットの検査方法 | |
JP2000077599A (ja) | 端子検査用治具 | |
JPS6218037Y2 (en]) | ||
JPH056348B2 (en]) | ||
KR940005440Y1 (ko) | 와이어 본딩상태 검사장치 | |
US20090254213A1 (en) | Mounting device for a chip component | |
JPS6167299A (ja) | 電子部品の打抜き収納装置 | |
JPS61152034A (ja) | ウエハプロ−バ装置 | |
KR0145126B1 (ko) | 반도체 장비의 대형칩용 플렌지 업 스테이지 | |
JP2752474B2 (ja) | ダイボンディング装置 |